To further enhance our leadership position in counterfeit detection and avoidance, North Shore Components offers as a value added service the OKOS MicroVue three-axis digital inspection system for semiconductor package integrity assessment.
The compact, portable OKOS MicroVue is a multi-lingual, all digital, ultra high resolution, high sensitivity ultrasonic inspection system for conducting material and package integrity measurements and inspections. The MicroVue system features:
Mechanical:
- Servo on scan axis
- 1.5 m/s max scan velocity
- +/- 0.5 micron accuracy & repeatability
- 0.5 micron data resolution
- Dual JEDEC trays
Fixtures:
- Simple JEDEC tray fixture
- Through-transmission transducer fixture
Sub Systems:
- High frequency digital pulser-receiver
- Display
- Operator-friendly multi-touch
- Dual LCD monitors
To learn more about the OKOS Microvue three-axis digital inspection system for assessing semiconductor package integrity, contact us today.
